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For use with the JEOL JSM-6300/6400F SEM Scanning Electron Microscope System This GW Electronics Type 43 Infrared Chamberscope is used working surplus
img{max-width:100%} Nikon Precision 4S065-965 RZTRM Amplifier Module SPA376C 4S013-684-1 Working
Estimated Packed Shipping Dimensions: L x W x H = 20"x20"x20" @ 17 lbs
in resalable condition with all original packaging including manuals
Inventory # A-9116
Nikon 300mm Wafer Inspection Stage Chuck NRM-3100 Overlay Measurement Working For use with the JEOLNikon 300mm Wafer Inspection Stage Chuck NRM 3100 Overlay Measurement Working Model No: Inspection Stage Chuck Removed from a Nikon NRM 3100 300mm Wafer Overlay Measurement System This item is working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 24"x24"x24" @ 25 lbs. Shipping Terms: All Domestic and
US$ 225.00
US$ 1081.50
US$ 19.99
US$ 10.00